Análise da transição de fase de silício em “scratch tests” de alta velocidade

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Análise da transição de fase de silício em “scratch tests” de alta velocidade

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dc.contributor Universidade Federal de Santa Catarina. pt_BR
dc.contributor.advisor Süssmaier, Stefan
dc.contributor.author Dias, Ariely Miranda
dc.date.accessioned 2023-05-25T12:29:17Z
dc.date.available 2023-05-25T12:29:17Z
dc.date.issued 2021-12-16
dc.identifier.uri https://repositorio.ufsc.br/handle/123456789/246082
dc.description TCC (graduação) - Universidade Federal de Santa Catarina, Centro Tecnológico, Engenharia de Materiais. pt_BR
dc.description.abstract When cutting brittle materials at small scales, machining in ductile regime can be obtained. Increasing the depth of cut to a critical value leads to a ductile to brittle transition in the removal process. The ductile machining is associated with phase transitions. This study investigated the change in the phase transitions when machining monocrystalline silicon with a diamond indenter. The experimental setup kinematic was that of a face turning process with no overlapping trace, with Vickers and Berkovich indenters in different orientations. The analysis of phases was performed in Raman microspectroscopy. The scratches provided evidence that even the material removal mechanism being different for the different indenters and orientations, this change does not have a significant influence on the Raman intensity ratio of amorphous phase against crystalline phase. For the diamond wire sawing process, this means that the grain shape of diamonds in the wire will not influence the surface residual phases. pt_BR
dc.language.iso en pt_BR
dc.publisher Zurich, Suíça pt_BR
dc.rights Open Access. en
dc.subject silício pt_BR
dc.subject transição de fase pt_BR
dc.subject scratch test pt_BR
dc.title Análise da transição de fase de silício em “scratch tests” de alta velocidade pt_BR
dc.title.alternative Analysis of the Phase Transition during High Speed Scratching of Silicon pt_BR
dc.type TCCgrad pt_BR
dc.contributor.advisor-co Xavier, Fábio Antonio


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ARIELY MIRANDA DIAS - TCC ETH SUÍÇA.pdf 13.50Mb PDF View/Open When cutting brittle materials at small scales, machining in ductile regime can be obtained. Increasing the depth of cut to a critical value leads to a ductile to brittle transition in the removal process. The ductile machining is associated with phase transitions. This study investigated the change in the phase transitions when machining monocrystalline silicon with a diamond indenter. The experimental setup kinematic was that of a face turning process with no overlapping trace, with Vickers and Berkovich indenters in different orientations. The analysis of phases was performed in Raman microspectroscopy. The scratches provided evidence that even the material removal mechanism being different for the different indenters and orientations, this change does not have a significant influence on the Raman intensity ratio of amorphous phase against crystalline phase. For the diamond wire sawing process, this means that the grain shape of diamonds in the wire will not influence the surface residual phases.

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